A Fast Algorithm for Mining Top-Rank-k Erasable Closed Patterns | Khoa học - Công nghệ

Authors

Ham Nguyen, Tuong Le

Publication year

2022

Index (WoS/Scopus)

WoS

Publisher

Tech Science Press

Journal

Computers, Materials and Continua

Link

https://www.techscience.com/cmc/v72n2/47180

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