Physical Layer Security in wireless sensors networks with friendly jammer: Secrecy Outage Probability Analysis

Authors

Bui Vu MINH, N.H.K. NHAN, Thu-Ha Thi PHAM, Minh Tran , Sung-Won KIM

Publication year

2024

Index (WoS/Scopus)

WoS

Publisher

VSB-Technical University of Ostrava

Journal

Advances in Electrical and Electronic Engineering

Link

https://advances.vsb.cz/index.php/AEEE/article/view/5840

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