Physical Layer Security in wireless sensors networks with friendly jammer: Secrecy Outage Probability Analysis

Authors
Bui Vu MINH, N.H.K. NHAN, Thu-Ha Thi PHAM, Minh Tran , Sung-Won KIM
Publication year
2024
Index (WoS/Scopus)
WoS
Publisher
VSB-Technical University of Ostrava
Journal
Advances in Electrical and Electronic Engineering
Link
https://advances.vsb.cz/index.php/AEEE/article/view/5840